EPMA Measurements of Diffusion Profiles at the Submicrometre Scale
نویسندگان
چکیده
منابع مشابه
Specific Effects and Deconvolution in Submicrometre EPMA: Application to Binary Diffusion
Electron probe (X-ray) microanalysis (EPMA) is nowadays a classical and well-established method for qualitative and (semi)quantitative evaluation of the elemental composition of the (near)surface of a sample on the micrometre scale. This technique can be used to determine concentration profiles due to (inter)diffusion in materials at submicrometre resolution if physical and geometrical effects ...
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ژورنال
عنوان ژورنال: Microchimica Acta
سال: 2002
ISSN: 0026-3672,1436-5073
DOI: 10.1007/s006040200032